Fundamentals of Atomic Force Microscopy : Part I: Foundations - Reifenberger Ronald G.
Fundamentals of Atomic Force Microscopy : Part I: Foundations - Reifenberger Ronald G. The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples…
Specifikacia Fundamentals of Atomic Force Microscopy : Part I: Foundations - Reifenberger Ronald G.
Fundamentals of Atomic Force Microscopy : Part I: Foundations - Reifenberger Ronald G.
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. The intelligent use of this instrument requires knowledge from many distinct fields of study.
Useful as a study guide to "Fundamentals of AFM", an online video course available at https: //nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
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