Scanning Electron Microscopy

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons,… Celý popis ↓

VýrobcaSpringer-Verlag Berlin and Hei

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Popis Scanning Electron Microscopy

Scanning Electron Microscopy

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Scanning Electron Microscopy patrí medzi produkty, ktoré ponúkajú vyvážený pomer kvality a ceny. V hornej časti stránky nájdeš hlavný prehľad, nižšie podrobné vlastnosti a technické parametre.

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Springer-Verlag Berlin and Hei

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